Ключевые слова: chalcogenide, electrodeposition, films, fabrication, voltage, X-ray diffraction, microstructure, experimental results
Mancini A., Rufoloni A., Vannozzi A., Celentano G., Braccini V., Putti M., Augieri A., Piperno L., Masi A., Cialone M., Iebole M., Botti S., Bonfigli F., Savio L.
Mancini A., Rufoloni A., Vannozzi A., Celentano G., Braccini V., Putti M., Rizzo F., Augieri A., Armenio A.A., Martinelli A., Sotgiu G., Meledin A., Pinto V., Piperno L., Manca N., Cialone M., Iebole M.
Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Armenio A.A., Pinto V., Piperno L., Masi A., Campagna E., Salvato M.
Mancini A., Rufoloni A., Vannozzi A., Kursumovic A., MacManus-Driscoll J.L., Celentano G., Tendeloo G.V., Rizzo F., Augieri A., Meledin A., Pinto V., Feighan J., Mayer J.
Ключевые слова: HTS, YBCO, films epitaxial, substrate SrTiO3, nanodoping, nanoscaled effects, PLD process, pinning centers artificial, microstructure, X-ray diffraction, lattice parameter, critical temperature, critical caracteristics, Jc/B curves, growth rate, pinning force, temperature dependence, critical current density, angular dependence, fabrication, experimental results
Galluzzi V., Mancini A., Puig T., Celentano G., Palau A., Obradors X., Bartolome E., Augieri A., Pompeo N., Silva E., Torokhtii K., Alimenti A.
Ключевые слова: HTS, YBCO, films epitaxial, PLD process, chemical solution deposition, substrate LaAlO3, nanoscaled effects, anisotropy, impedance, angular dependence, magnetic field dependence, measurement technique, defects, nanorods, twin boundaries, nanoparticles, pinning mechanism, flux flow resistance, comparison
Mancini A., Rufoloni A., Vannozzi A., Braccini V., Putti M., Manfrinetti P., Rizzo F., Augieri A., Silva E., Armenio A.A., Pinto V., Piperno L., Sylva G., Masi A., Prili S., Celentano E.S.
Ключевые слова: chalcogenide, FeSeTe, films, PLD process, fabrication, buffer layers, films epitaxial, chemical solution deposition, substrate single crystal, substrate sapphire, substrate SrTiO3, X-ray diffraction, microstructure, resistive transition, resistance, temperature dependence, critical caracteristics, Jc/B curves, pinning force
Petrisor T., Ciontea L., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Armenio A.A., Sotgiu G., Mos R.B., Pinto V., Piperno L., Petrisor JrT.
Ключевые слова: HTS, YBCO, films, template layers, substrate SrTiO3, nanoscaled effects, microstructure, critical caracteristics, critical current density, fabrication, MOD process, surface, pinning centers artificial, X-ray diffraction, Jc/B curves, angular dependence, pinning force, lattice parameter, magnetic field dependence, experimental results
Malagoli A., Ferdeghini C., Mancini A., Vannozzi A., Celentano G., Braccini V., Putti M., Manfrinetti P., Pallecchi I., Bernini C., Bellingeri E., Leveratto A., Sylva G., Lisitskiy M., Manca N., Provino A.
Ключевые слова: chalcogenide, FeSeTe, coated conductors, buffer layers, texture, thickness dependence, RABITS process, substrate Hastelloy, substrate Ni-W, X-ray diffraction, microstructure, resistive transition, magnetic field dependence, critical caracteristics, Jc/B curves, critical temperature, upper critical fields
Mancini A., Rufoloni A., Vannozzi A., Celentano G., Augieri A., Armenio A.A., Sotgiu G., Pinto V., Piperno L., Santoni A., Rondino F., Tortora L.
Mancini A., Rufoloni A., Vannozzi A., Celentano G., Augieri A., Pompeo N., Angrisani A.A., Sotgiu G., Pinto V., Piperno L., Frolova A., Santoni A., Rondino F.
Petrisor T., Ciontea L., Mancini A., Rufoloni A., Vannozzi A., Jr., Rizzo F., Augieri A., Marzi G.D., Armenio A.A., Sotgiu G., Mos R.B., Pinto V., Piperno L., Petrisor T. J., Celentano a.G.
Ferdeghini C., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Braccini V., Putti M., Augieri A., Bellingeri E., Sylva G.
Ключевые слова: chalcogenide, FeSeTe, coated conductors, RABITS process, template layers, fabrication, substrate Ni-W, X-ray diffraction, PLD process, microstructure, buffer layers, texture, resistivity, temperature dependence, magnetic field dependence, upper critical fields, irreversibility fields, critical caracteristics, Jc/B curves, pinning force
Petrisor T., Ciontea L., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Armenio A.A., Sotgiu G., Mos R.B., Pinto V., Piperno L., jr T.P.
Petrisor T., Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Fabbri F., Rizzo F., Augieri A., Rubanov S., Armenio A.A., Pinto V.
Petrisor T., Ciontea L., Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Armenio A.A., Sotgiu G., Mos R.B., Nasui M., Pinto V., Piperno L., Gabor M.
Petrisor T., Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Armenio A.A., Sotgiu G., Pinto V., Piperno L.
Ключевые слова: HTS, coated conductors, YBCO, substrate Ni-Cu, substrate Ni-W, substrate Ni-W-Cu, buffer layers, fabrication, PLD process, chemical solution deposition, electron beam evaporation, microstructure, heat treatment, annealing process, grain boundaries, films epitaxial, X-ray diffraction, experimental results
Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Fabbri F., Rizzo F., Augieri A., Armenio A.A., Pinto V., Piperno L., Masi A., Barba L., Arrighetti G., Campi G.
Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Pompeo N., Silva E., Torokhtii K., Frolova A.
Ключевые слова: HTS, YBCO, thin films, PLD process, substrate SrTiO3, fabrication, nanodoping, critical caracteristics, pinning, measurement technique, critical current density, microwave devices, Jc/B curves, pinning force, angular dependence, surface impedance, magnetic field dependence, nitrogen liquid , experimental results
© Copyright 2006-2012. Использование материалов сайта возможно только с обязательной ссылкой на сайт.
Свои замечания и пожелания вы можете направлять по адресу perst@isssph.kiae.ru
Техническая поддержка Alexey, дизайн Teodor.